Discretely controlled micromirror with multi-level positions

ABSTRACT

This invention provides the two types of Discretely Controlled Micromirror (DCM), which can overcome disadvantages of the conventional electrostatic micromirrors. The first type micromirror is a Variable Supporter Discretely Controlled Micromirror (VSDCM), which has a larger displacement range than the conventional electrostatic micromirror. The displacement accuracy of the VSDCM is better than that of the conventional electrostatic micromirror and the low driving voltage is compatible with IC components. The second type of DCM, the Segmented Electrode Discretely Controlled Micromirror (SEDCM) has same disadvantages with the conventional electrostatic micromirror. But the SEDCM is compatible with known microelectronics technologies.

BACKGROUND OF THE INVENTION

The present invention relates to a micromirror device with discrete multi-level positions.

Micromirror devices have been developed because it can substitute for conventional optoelectronic devices. A phase-only piston-style micromirror was used for phase adaptive optics applications and a rotational micromirror was used to deflect a light. Most of these micromirrors have been controlled to have continuous displacements, which are determined at the equilibrium between electrostatic force and elastic force. The analog control is more complex than the digital or discrete control, and is not compatible with known semiconductor electronics technologies such as MOS, CMOS, etc. In addition, the micromirrors with continuous displacement actuated by electrostatic force undergo the classical snap-down phenomenon when the electric force exceeds the elastic force of mechanical structure. The snap-down phenomenon limits the translational and rotational ranges of a micromirror.

The high driving voltage is also another acute disadvantage in practical use of the micromirrors with continuous displacement actuated by electrostatic force. To be compatible with IC components, it is desired that micromirrors are operated at low voltage which is compatible with the circuit operation or control voltage.

In the prior art of micromirror array like Digital Micromirror Device in U.S. Pat. Nos. 4,566,939, 5,083,857, and 6,232,936, each micromirror is actuated by digital control of a voltage. It has large rotation, has a low driving voltage, and is compatible with known semiconductor electronics technologies. But, it has only single degree of freedom; rotation about an axis and two level positions. So, the micromirror array is merely the array of optical switches.

To be applied more widely, a micromirror is needed to have multi-level position control and large displacements, multi degrees of freedom motions, low driving voltage, and compatibility with known semiconductor electronics technologies.

SUMMARY OF THE INVENTION

The present invention contrives to solve the disadvantages of conventional micromirror devices with continuous displacement actuated by electrostatic force and limitations of Digital Micromirror Device (DMD).

An objective of the invention is to provide a micromirror with accurate and fast multi-level position control.

Another objective of the invention is to provide a micromirror with multi-degree-of-freedom motions.

Still another objective of the invention is to provide a micromirror with large displacements.

Still another objective of the invention is to provide a micromirror with very short settling time.

Still another objective of the invention is to provide a micromirror with low driving voltage compatible with known IC circuits operation or control voltage of IC circuits.

The conventional electrostatic micromirrors undergo the classical snap-down phenomenon when the electric force exceeds the elastic force due to mechanical structure. The snap-down phenomenon limits the translational and rotational ranges of a micromirror. The slow settling time of the conventional electrostatic micromirror reduces the operating speed of the micromirror. And, the high driving voltage of the conventional electrostatic micromirror gives difficulties in practical use. To be compatible with IC components which are normally operated at 5V or less than 5V and to prevent the electrical breakdown due to high electric field, the maximum value of the driving voltage should generally be as low as possible. Low displacement accuracy is also acute disadvantage of the conventional electrostatic micromirrors. The displacement accuracy goes bad by n³ times as spring thickness variation increases n times. To solve those disadvantages of the conventional electrostatic micromirrors, the Discretely Controlled Micromirror (DCM) is invented.

The first type of the DCM is the Variable Supporter Discretely Controlled Micromirror (VSCDM), which uses supporters controlling gaps between the micromirror and substrate. The supporters are located under the micromirror. Displacements of the DCM are determined by combinations of gaps, which are determined by the supporters where the micromirror rests. The gaps determined by supporters are controlled by electrostatic force and the micromirror rests on the controlled supporters by an attractive electrostatic force. Digital voltage or discrete voltage operation is preferable method to control the electrostatic force. Therefore, combinations of gaps determine translation and rotation of the micromirror.

Three preferred VSDCM embodiments are explained. The first preferred embodiment is a micromirror comprising one or more digital supporters. A gap that each supporter provides has two values because the gap is determined by bistable motion of the supporter. The motion is controlled by electrostatic force. Digital voltage or discrete voltage operation is preferable method to control the electrostatic force. The VSDCM uses bistable displacements of the supporters for the displacement control of the micromirror.

The second preferred embodiment is a micromirror comprising one or more multi-level supporters. A gap that each supporter provides has discrete multi-step because the gap is determined by discrete height change of the supporter. The height change is controlled by electrostatic force. Digital voltage or discrete voltage operation is preferable method to control the electrostatic force. The VSDCM uses the discrete height change of the supporters for the displacement control of the micromirror.

The third preferred embodiment is a micromirror comprising one or more multi-position supporters. In-plane position supporting the micromirror is controlled to be changed by the multi-position supporters. Because the displacements of the micromirror are determined by not only heights of the supporters but also the supporting positions, multi-position supporters can control the displacements of the micromirror.

For the conventional electrostatic micromirror, the spring thickness accuracy of the micromirror determines displacement accuracy. The spring stiffness error of thin spring is higher than the spring stiffness error of thick spring if they have the same thickness error. Therefore, it is difficult to use low driving voltage because thin spring is undesirable. Because the VSDCM uses bistable or discrete displacement, spring thickness accuracy is not critical. Therefore, the spring of the micromirror with very low stiffness can be used. The VSDCM with the spring of low stiffness can be operated by low voltage. Independently controlled variable supporters require individually addressable electronics. To achieve this, the micromirror combined with on-chip electronics is used. In order to do this, wafer-level integration of the micromirror with known semiconductor microelectronics is used.

Because the micromirror rests on the variable supporters of the VSDCM, thickness accuracy of the variable supporters is the displacement accuracy of micromirror. The VSDCM has much better accuracy for large displacement because the accuracy is not dependent on the range of displacement.

The second type of DCM is the Segmented Electrode Discretely Controlled Micromirror (SEDCM), which uses the segmented electrode pads. The SEDCM has the same disadvantages like small displacement range and poor accuracy for large displacement as the conventional electrostatic micromirrors do. But, The SEDCM is compatible with known semiconductor microelectronics technologies because the SEDCM can be controlled by discrete voltage. Displacements of the micromirror can be controlled by appropriate combinations of area size, position, and voltage of each electrode pad.

The VSDCM and the SEDCM can be fabricated with two different methods. The first method uses metals; aluminum, nickel, gold, and copper for structural layer, and photoresist or SiO₂ for the sacrificial layers that forms the air gaps. The fabrication of the DCM begins with a wafer on which a completed semiconductor microelectronics circuit is fabricated. A thick oxide is deposited over metal of the semiconductor microelectronics and then planarized using known polishing methods such as chemical mechanical polishing (CMP) techniques and so on. The polishing step provides a completely flat surface for the digital structure. The CMP ensures that thickness variation, flatness and reflectivity of micromirrors are not degraded. Through the use of several photomask layers, the structure of micromirrors is formed with metal layers for the spring, posts, and micromirror layer. And the air gap of DCM is formed by known sacrificial materials such as photoresist or SiO₂. A metal is sputter-deposited or evaporated and plasma-etched by using plasma-deposited SiO₂ as the etch mask. Later in the packaging flow, the sacrificial layers are plasma-ashed to form the air gaps.

The second method uses known electroplating techniques. This method utilizes a sacrificial metallic mold, which plays multiple roles of an electroplating mold for posts and seed layers for next-level electroplating at the same time. Therefore, this method can simplify the fabrication process and demonstrate real 3-D metallic microstructures without limitation on the number of levels. This method only uses conventional lithography and electroplating, and known polishing such as CMP. As an example, electroplated nickel is used for structural layers and electroplated copper is used for sacrificial layers, respectively.

The reflective surface of the micromirror is made of metal, metal compound, multi-layered dielectric material, or other materials with high reflectivity. Many known microfabrication processes can make the surface of the micromirror to have high reflectivity. The micromirrors are electrostatically controlled to have desired positions with actuating components. According to applications, a translation, a rotation, a translation and a rotation, or a translation and two rotations can be controlled.

As described in the applicant's U.S. patent application for “Variable Focal Length Lens Comprising Micromirrors with Two Degrees of Freedom Rotation”, which was filed on May 27, 2004, applicant's another U.S. patent application for “Variable Focal Length Lens Comprising Micromirrors with Two Degrees of Freedom Rotation and One Degree of Freedom Translation” which was filed on May 27, 2004, and the applicant's still another U.S. patent application for “Array of Micromirror Array Lenses”, which was filed on May 28, 2004, the disclosures of which are incorporated by reference as if fully set forth herein, the micromirror array comprising the micromirrors with two degrees of freedom rotation or two degrees of freedom rotation and one degree of freedom translation which are controlled independently can modulate incident lights arbitrarily. In order to do this, it is required that incident lights are deflected to a desired arbitrary direction by controls of two degrees of freedom rotation or controls of two degrees of freedom rotation and one degree of freedom translation. Independent translation of each micromirror is also required to satisfy the phase condition. Because the DCM have many advantages and can have two degrees of freedom rotation and/or one degree of freedom translation, the micromirror array comprising the DCM has better performance than the conventional micromirror array.

Electric circuits to operate the micromirror array can be replaced with known MOS or CMOS technologies, which are widely used in microelectronics. By applying the microelectronics circuits under the micromirror array, the effective reflective area can be increased by removing necessary area for electrode pads and wires. Each micromirror can tilt along two axes as well as retract. As a result the micromirror can scan a field of view along both vertical and horizontal axes and simultaneously retract or elevate to remove phase aberrations of an incident optical beam. The micromirror array can correct aberration, e.g. optical effects due to the medium between the object and its image or defects of a lens system that cause its image to deviate from the rules of paraxial imagery, by controlling each micromirror independently. To compensate for aberration with arbitrary phase error, each micromirror of micromirrror array should be controlled independently. Independent control of each micromirror is possible by replacing electric circuits required for control with known CMOS technologies and fabricating the CMOS underneath the micromirrors using known microfabrication methods.

The micromirrors of the invention are desirably shaped to permit a closely packed array and can be rounded in shape but desirably are angular, e.g. triangular, rectangular or have five or more sides, including hexagonal, octagonal and the like.

In order to achieve the above objectives, the first type of the present invention provides a discretely controlled micromirror (DCM) that includes a micromirror and a plurality of variable supporters on which the micromirror rests. The variable supporters determine the position of the micromirror, and the variable supporters are controlled by electrostatic force. Digital voltage or discrete voltage operation is preferable method to control the electrostatic force. The variable supporters are located under the micromirror. In-plane position of the variable supporters is variable to get arbitrary displacements of the micromirror from digital or discrete variable supporters.

The variable supporters are placed between the micromirror and a substrate. Each of the variable supporters is controlled to change its height so that the position of the micromirror is controlled.

The variable supporters determine the gap between the micromirror and the substrate.

Each of the digital supporters comprises a top post, a bottom post, and/or one or more inserter that is inserted between the top post and the bottom post in its on position and taken out from the gap between the top post and the bottom post in its off position.

The gap is determined by whether the inserter is placed between a top post and a bottom post.

Each of the discrete supporters comprises a top post, a bottom post, and/or one or more multi-step inserter that is inserted between the top post and the bottom post. The inserter with multi-step thickness determines displacements of the micromirror according to the inserted amount.

The gap is determined by the inserted amount of the multi-step inserter.

The inserter is controlled by electrostatic force.

The inserter is controlled by digital voltage or discrete voltage operation.

The inserter has in-plane translation. The in-plane translation is actuated by a comb-drive.

The inserter has multi-step thickness.

The in-plane positions of the variable supporters are changed.

In the operation of DCM, the rotation and/or translation of the micromirror is controlled. Both rotation and translation of the micromirror are controlled by three or more than three variable supporters. The variable supporter has bistable motion. The variable supporter has discrete motion. The micromirror rests on the controlled variable supporter by attractive force.

The surface material of the micromirror is the one with high reflectivity. The surface material of the micromirror may be metal or metal compound. Also the surface of the micromirror is made with multi-layered dielectric coating.

The DCM is made by a method in which the material of a structural layer is metal. An aluminum layer is sputter-deposited and plasma-etched using plasma-deposited SiO₂ as an etch mask. The sacrificial layers are plasma-ashed to form the air gaps.

The DCM is made by a method in which layers deposited by microfabrication process are planarized using a chemical mechanical polishing (CMP) technique.

In the DCM, the micromirror is fabricated using electroplating techniques. The electroplating technique uses the unique sacrificial metallic mold that plays multiple roles of an electroplating mold for posts and seed layers. Electroplated nickel is used for structural layers. Electroplated copper is used for sacrificial layers.

The invention also provides a DCM array comprising a plurality of the above-described DCM. In the DCM array, the micromirrors are controlled independently. The micromirror array is a Spatial Light Modulator (SLM).

A control circuitry is constructed under the micromirror using microelectronics technologies. A thick oxide is deposited over metal of the microelectronics circuits.

The second type of the invention provides a DCM that includes a micromirror and a plurality of segmented electrodes. The segmented electrodes determine the displacements of the SEDCM. The applied voltage to segmented electrodes is discrete. The SEDCM is controlled by electrostatic force. The SEDCM is controlled by digital voltage or discrete voltage operation. The segmented electrodes are located under the micromirror. In-plane positions of the segmented electrodes are changed.

In the operation of the SEDCM, rotation and/or translation of the micromirror is controlled. The areas of the segmented electrodes are changed. The surface material of the SEDCM has high reflectivity. The surface material of the SEDCM may be metal or metal compound. Also, the surface of the SEDCM is made with multi-layered dielectric coating.

The SEDCM is made by a method in which the material of structural layer is metal. An aluminum layer is sputter-deposited and plasma-etched using plasma-deposited SiO₂ as an etch mask. The sacrificial layers are plasma-ashed to form the air gaps.

The SEDCM may be made by a method in which layers deposited by microfabrication process are planarized using a chemical mechanical polishing (CMP) technique.

The micromirror is fabricated using electroplating techniques. The electroplating technique uses the unique sacrificial metallic mold, which plays multiple roles of an electroplating mold for posts and seed layers. Electroplated nickel is used for structural layers. Electroplated copper is used for sacrificial layers.

The invention also provides a DCM array comprising the previously described DCM. In the array, the micromirrors are controlled independently. The micromirror array is a Spatial Light Modulator (SLM). A control circuitry is constructed under the SEDCM using microelectronics technologies. A thick oxide is deposited over metal of the microelectronics circuits.

Although the present invention is briefly summarized, the full understanding of the invention can be obtained by the following drawings, detailed description, and appended claims.

DESCRIPTION OF THE FIGURES

These and other features, aspects and advantages of the present invention will become better understood with reference to the accompanying drawings, wherein

FIG. 1 is a schematic diagram showing the DCM with variable supporters;

FIG. 2 is a schematic diagram showing how the VSDCM has three degrees of freedom motions; one translation motion along the normal axis to the plane of the micromirror and two rotational motions about the axes in the plane;

FIGS. 3 a-3 d are schematic diagrams showing digital variable supporters and four different displacements of the DCM comprising the digital variable supporter;

FIG. 4 is a schematic diagram showing an inserter actuating system including inserter;

FIG. 5 is a schematic diagram showing an inserter actuating system using a comb-drive;

FIG. 6 is a schematic diagram showing a discrete variable supporter with the multi-step inserter;

FIGS. 7 a and 7 b are schematic diagrams showing a multi-position supporter; and

FIG. 8 is a schematic diagram showing the DCM comprising segmented electrodes.

DETAILED DESCRIPTION OF PREFERRED EMBODIEMENTS

FIG. 1 shows the concept of DCM with the variable supporters 1. The variable supporter discretely controlled micromirror (VSDCM) use supporters 1 providing various gaps between the micromirror 2 and substrate 8. The supporters 1 are located under the micromirror 2. Translation and rotation of the VSDCM are determined by combination of the gaps, which are determined by variable supporters 3, 4 that the micromirror 5 rests. The gaps determined by the variable supporters are controlled digitally or discretely and the micromirror rests on the controlled supporters 3, 4 by attractive force 6. Therefore, the gaps provided by the supporters determine translation and/or rotation of the micromirror. Gap variation by the supporters is determined by digital or discrete motion of the supporters and the motions are controlled by electrostatic force. Digital voltage or discrete voltage operation is preferable method to control the electrostatic force. The position of micromirror 5 is restored into initial position by force of flexible spring 7 when the attraction force is off.

FIG. 2 shows how the VSDCM can have motions of three degrees of freedom; one translational motion along the normal axis to the plane of the micromirror and two rotational motions about the axes in the plane. When three variable supporters 11, 12, 13 or more than three variable supporters among many variable supporters 14 are used to support the micromirror 15, the VSDCM has three degree of freedom. Three variable supporters are enough to make three degree of freedom of micromirror, but more than three variable supporters can be used so that the micromirror which rests on supporters stays stably.

Height accuracy of the variable supporters gives the displacement accuracy of the VSDCM because the micromirror 15 rests on the variable supporters 11, 12, 13. The thickness control accuracy of microfabrication to make the variable supporter is less than several nanometers. The displacement accuracy of conventional electrostatic micromirror goes bad by n³ times as spring thickness variation of the micromirror increases n times. Therefore, the VSDCM has much better accuracy in control of displacement than the conventional electrostatic micromirror.

FIGS. 3 a-3 d show an exemplary digital variable supporter and four possible displacements of the VSDCM supported by the two variable supporters 23, 24.

The variable supporters 23, 24 are placed between the micromirror 25 and a substrate 27. Each of the variable supporters 23, 24 is controlled to change its height so that the position of the micromirror 25 is controlled.

Even though FIGS. 3 a-3 d show the digital VSDCM, supported by two variable supporters, with two degrees of freedom (one translational motion and one rotational motion), many variable supporters can be made under the micromirror and the micromirror, supported by three or more variable supporters, with three degrees of freedom (one translational motion and two degrees of rotational motion) is also possible. The variable supporters 23, 24 comprise an inserter 20, a top post 21 and/or a bottom post 22. The inserter 20 with bistable motion is controlled by electrostatic force. Digital voltage or discrete voltage operation is preferable method to control the electrostatic force. Each variable supporter 23, 24 controlled by the electrostatic force can provide controllable two different gaps G1, G2 depending on whether the inserters 20 are inserted or not. The inserter 20, the top post 21 and the bottom post 22 can have different heights because combination of their heights can make various gaps. Each supporter provides two positions, on-off positions, to a micromirror 25 at the position where the supporter is located. Since a translation and a rotation of the VSDCM are determined by combinations of the gaps provided by the supporters 23, 24 actuation, the number of feasible displacements is 2^(n), where n is the number of supporters. At the discrete gaps given by the supporters, the micromirror 25 can have desired translation and rotation by adjusting the in-plane position of each supporter.

FIG. 4 shows an example of an inserter actuating system including an inserter 30. The inserter actuating system comprises two bottom electrodes 31 a, 31 b, a top electrode 32, one or more springs 33, one or more posts 34, and an inserter 30. The top electrode 32 held by the springs 33 is actuated by electrostatic force between the top electrode 32 and one of the bottom electrodes 31 a, 31 b. In this way, the inserter 30 on the top electrode 32 can be moved.

FIG. 5 shows another example of an inserter actuating system. An inserter 41 should have in-plane translation. A very well-known comb-drive 40 may give in-plane translation to the inserter 41.

FIG. 6 shows a multi-step inserter 42 to make multi-step gaps. In contrast with the inserter 30 with one thickness, the multi-step inserter 42 has several step thicknesses. According to in-plane position of the inserter 42, the thickness of the multi-step inserter located between a top post 43 and a bottom post 44 is changed. Therefore, displacement of a micromirror 45 can be changed. Very well-known comb-drives may give in-plane translation 46 to the multi-step inserter 42.

FIG. 7 a shows a top view of multi-position supporter comprising the inserter 47, 48 and several posts 49 with different in-plane positions. FIG. 7 b shows a three-dimensional drawing of the multi-position supporter to show the structure clearly. The supported position is changed by in-plane translation of the inserter 47, 48. For an example, the supporting position 49A of the micromirror 52 is changed to position 49B by in-plane translation 50 of the inserter 47. The supporting position 49C of the micromirror 52 is changed to position 49D by in-plane translation 51 of the inserter 48. Very well-known comb-drives may give the in-plane translation 50, 51 to the inserter 47, 48.

The supporting system combining the multi-position and the multi-step also can be used.

FIG. 8 shows the second type of the DCM using segmented electrodes 60. In contrast with conventional electrostatic micromirrors, this embodiment comprises segmented electrodes 60 with different areas, positions, and discrete voltages. This embodiment has the same disadvantages as the conventional electrostatic micromirror except for compatibility with known microelectronics technologies for the control circuit. The micromirror 61 can have the desired three degrees of freedom by the appropriate combinations of segmented electrodes 60 with different areas, positions, and discrete voltages.

The VSDCM and the SEDCM can be fabricated by two different methods. The first method uses metals such as aluminum, nickel, gold, and copper for structural layer, and photoresist or SiO₂ for the sacrificial layers that form the air gaps. The fabrication of the DCM begins with a wafer on which a completed microelectronics addressable circuits are fabricated. A thick oxide is deposited over metal of the circuits and then planarized using known polishing methods such as chemical mechanical polishing (CMP) techniques and so on. The polishing step provides a completely flat surface for the digital structure. The CMP ensures that thickness variation, flatness, and reflectivity of micromirrors are not degraded. Through the use of several photomask layers, the structure of micromirrors is formed with metal layers for the spring, posts and, micromirror layer. And, the air gap of DCMs is formed with photoresist or SiO₂. A metal is sputter-deposited and plasma-etched by using plasma-deposited SiO₂ as the etch mask. Later in the packaging flow, the sacrificial layers are plasma-ashed to form the air gaps.

The second method uses known electroplating techniques. This method utilizes the unique sacrificial metallic mold that plays multiple roles of an electroplating mold for posts and seed layers for next-level electroplating at the same time. Therefore, this method can simplify the fabrication process and demonstrate real 3-D metallic microstructures without limitation on the number of levels. This method only uses conventional photolithography and electroplating, and known polishing such as CMP. As an example, electroplated nickel is used for structural layers and electroplated copper is used for sacrificial layers respectively.

The reflective surface of the micromirror is made of metal, metal compound, multi-layered dielectric material or other materials that have high reflectivity. Many known microfabrication processes can make the surface of the micromirror to have high reflectivity. The micromirrors are electrostatically controlled to have desired positions by actuating components. Depending on applications, a translation, a rotation, a translation and a rotation, or a translation and two rotations can be controlled.

The array comprising the DCM with two degrees of freedom rotations or two degrees of freedom rotations and one degree of freedom translation, which are controlled independently can modulate incident lights arbitrarily. To do this, it is required that incident lights are deflected to the desired arbitrary directions by controls of two degree of freedom rotations or controls of two degree of freedom rotations and one degree of freedom translation. Independent translation of each micromirror is also required to adjust the phase of light.

The micromirror array can correct aberration, which is caused by optical effects due to the medium between the object and its image or is caused by defects of a lens system that cause its image to deviate from the rules of paraxial imagery, by controlling each micromirror independently.

Electric circuits to operate the micromirrors can be made with known the microelectronics circuits technologies where are used in microelectronics. Applying the microelectronics circuits under micromirror array, the effective reflective area can be increased by removing necessary area for electrode pads and wires. Independent control of each micromirror is also possible by making electric circuits required for control with known microelectronic circuit technologies. To increase optical efficiency, the microelectronics circuit is fabricated underneath the micromirrors by using known microfabrication methods.

The variable supporters and the microelectronics circuits are positioned beneath the micromirror so that no reflective service area is lost to these features. This means that individual micromirror assemblies can be placed closer to each other in order to maximize the effective area.

While the invention has been shown and described with reference to different embodiments thereof, it will be appreciated by those skills in the art that variations in form, detail, compositions and operation may be made without departing from the spirit and scope of the invention as defined by the accompanying claims. 

1. A discretely controlled micromirror (DCM) comprising: a) a micromirror; and b) a plurality of variable supporters on which the micromirror rests; wherein the variable supporters determine the position of the micromirror.
 2. The DCM of claim 1, wherein the variable supporters are controlled by electrostatic force.
 3. The DCM of claim 2, wherein the electrostatic force is controlled by digital and/or discrete operation of a voltage.
 4. The DCM of claim 1, wherein the variable supporters are located under the micromirror.
 5. The DCM of claim 4, wherein each of the variable supporters is controlled to change its height whereby the position of the micromirror is controlled.
 6. The DCM of claim 1, the micromirror rests on the controlled variable supporter by attractive force.
 7. The DCM of claim 6, wherein the attractive force is electrostatic force.
 8. The DCM of claim 6, wherein the electrostatic force is controlled by digital and/or discrete voltage operation.
 9. The DCM of claim 1, wherein the in-plane position of the variable supporters is changed.
 10. The DCM of claim 1, wherein the variable supporters determine the gap between the micromirror and the substrate.
 11. The DCM of claim 10, wherein each of the variable supporters comprises a top post, a bottom post, and/or one or more inserter that is inserted between the top post and the bottom post.
 12. The DCM of claim 11, wherein the inserter has in-plane translation.
 13. The DCM of claim 12, wherein the inserter has discrete in-plane translation.
 14. The DCM of claim 12, wherein the in-plane translation is actuated by a comb-drive.
 15. The DCM of claim 11, wherein the inserter has two positions, on-position and off-position, wherein the inserter is positioned between a top post and a bottom post in the on-position and the inserter is not positioned between a top post and a bottom post in the off-position.
 16. The DCM of claim 15, wherein the gap is determined by the on-off positions of the inserter.
 17. The DCM of claim 15, wherein the on-off positions of the inserter are controlled by electrostatic force.
 18. The DCM of claim 15, wherein the on-off motions is caused by torsion of torsional spring.
 19. The DCM of claim 11, wherein the inserter has multi-step thickness.
 20. The DCM of claim 11, wherein the in-plane positions of the inserter is controlled to change the supporting position.
 21. The DCM of claim 20, wherein the in-plane translation of the inserter are controlled by electrostatic force.
 22. The DCM of claim 21, wherein the electrostatic force is controlled by digital and/or discrete voltage operation.
 23. The DCM of claim 22, wherein the in-plane translation is actuated by a comb-drive.
 24. The DCM of claim 1, wherein the one degree of freedom rotation of the DCM is controlled.
 25. The DCM of claim 1, wherein the one degree of freedom translation of the DCM is controlled.
 26. The DCM of claim 1, wherein the two degrees of freedom rotation of the DCM is controlled.
 27. The DCM of claim 1, wherein the one degree of freedom rotation and the one degree of freedom translation of the DCM are controlled.
 28. The DCM of claim 1, wherein the two degrees of freedom rotation and the one degree of freedom translation of the DCM are controlled.
 29. The DCM of claim 28, wherein the two degrees of freedom rotation and the one degree of freedom translation of the DCM are controlled by three or more than three variable supporters.
 30. The DCM of claim 1, wherein the surface material of the micromirror is the one with high reflectivity.
 31. The DCM of claim 1, wherein the surface material of the micromirror is metal.
 32. The DCM of claim 1, wherein the surface material of the micromirror is metal compound.
 33. The DCM of claim 1, wherein the surface of the micromirror is made with multi-layered dielectric coating.
 34. The DCM of claim 1, wherein the DCM is made by a method in which the material of a structural layer is metal.
 35. The DCM of claim 34, wherein an aluminum layer is sputter-deposited and plasma-etched using plasma-deposited SiO₂ as an etch mask.
 36. The DCM of claim 34, wherein the material of a sacrificial layer that forms air gaps is a photoresist.
 37. The DCM of claim 1, wherein the DCM is made by a method in which layers deposited by microfabrication process are planarized using a chemical mechanical polishing (CMP) technique.
 38. The DCM of claim 1, wherein the micromirror is fabricated using electroplating techniques.
 39. The DCM of claim 38, wherein the electroplating technique uses the unique sacrificial metallic mold that plays multiple roles of an electroplating mold for posts and seed layers.
 40. The DCM of claim 38, wherein electroplated nickel is used for structural layers.
 41. The DCM of claim 38, wherein electroplated copper is used for sacrificial layers.
 42. A DCM array comprising a plurality of the DCM of claim
 1. 43. The DCM array of claim 42, wherein the micromirrors are controlled independently.
 44. The DCM of claim 43, wherein a control circuitry is constructed under the micromirror using microelectronics technologies.
 45. The DCM of claim 44, wherein a thick oxide is deposited over metal of the microelectronics circuits.
 46. The DCM array of claim 42, wherein the micromirrors are mounted in side-by-side array.
 47. The DCM array of claim 42, wherein the micromirrors are mounted in side-by-side array to define a spatial light modulator (SLM).
 48. The SLM of claim 47, wherein the one degree of freedom rotation of the DCM is controlled to scan a field of regard.
 49. The SLM of claim 47, wherein the two degrees of freedom rotation of the DCM is controlled to scan a field of regard.
 50. The SLM of claim 47, wherein the one degree of freedom translation of the DCM is controlled to retract or elevate to lengthen or shorten the optical path of an image reflected to remove phase aberration from image.
 51. The SLM of claim 47, wherein the one degree of freedom rotation of the DCM is controlled to scan a field of regard, which the DCM can also retract or elevate to lengthen or shorten the optical path of an image reflected to remove phase aberration from image.
 52. The SLM of claim 47, wherein the two degrees of freedom rotation of the DCM is controlled to scan a field of regard, which the DCM can also retract or elevate to lengthen or shorten the optical path of an image reflected to remove phase aberration from image.
 53. A DCM comprising: a) a micromirror; and b) a plurality of segmented electrodes; wherein the segmented electrodes determine the position of the micromirror, wherein the applied voltage to segmented electrodes is digital and/or discrete.
 54. The DCM of claim 53, wherein the DCM is controlled by electrostatic force.
 55. The DCM of claim 54, wherein the electrostatic force is controlled by digital and/or discrete voltage operation.
 56. The DCM of claim 53, wherein the segmented electrodes are located under the micromirror.
 57. The DCM of claim 53, wherein in-plane positions of the segmented electrodes are changed.
 58. The DCM of claim 53, wherein the one degree of freedom rotation of the DCM is controlled.
 59. The DCM of claim 53, wherein the one degree of freedom translation of the DCM is controlled.
 60. The DCM of claim 53, wherein the two degrees of freedom rotation of the DCM is controlled.
 61. The DCM of claim 53, wherein both the one degree of freedom rotation and the one degree of freedom translation of the DCM are controlled.
 62. The DCM of claim 53, wherein both the two degrees of freedom rotation and the one degree of freedom translation of the DCM are controlled.
 63. The DCM of claim 53, wherein the areas of the segmented electrodes are changed.
 64. The DCM of claim 53, wherein the surface material of the micromirror is the one with high reflectivity.
 65. The DCM of claim 53, wherein the surface material of the micromirror is metal.
 66. The DCM of claim 53, wherein the surface material of the micromirror is metal compound.
 67. The DCM of claim 53, wherein the surface of the micromirror is made with multi-layered dielectric coating.
 68. The DCM of claim 53, wherein the DCM is made by a method in which the material of structural layer is metal.
 69. The DCM of claim 68, wherein an aluminum layer is sputter-deposited and plasma-etched using plasma-deposited SiO₂ as an etch mask.
 70. The DCM of claim 68, wherein the material of a sacrificial layer that forms air gaps is a photoresist.
 71. The DCM of claim 53, wherein the DCM is made by a method in which layers deposited by microfabrication process are planarized using a chemical mechanical polishing (CMP) technique.
 72. The DCM of claim 53, wherein the micromirror is fabricated using electroplating techniques.
 73. The DCM of claim 72, wherein the electroplating technique uses the unique sacrificial metallic mold, which plays multiple roles of an electroplating mold for posts and seed layers.
 74. The DCM of claim 72, wherein electroplated nickel is used for structural layers.
 75. The DCM of claim 72, wherein electroplated copper is used for sacrificial layers.
 76. A DCM array comprising the DCM of claim
 53. 77. The DCM array of claim 76, wherein the micromirrors are controlled independently.
 78. The DCM array of claim 76, wherein the micromirrors are mounted in side-by-side array.
 79. The DCM array of claim 76, wherein the micromirrors are mounted in side-by-side array to define a spatial light modulator (SLM).
 80. The SLM of claim 79, wherein the one degree of freedom rotation of the DCM is controlled to scan a field of regard.
 81. The SLM of claim 79, wherein the two degrees of freedom rotation of the DCM is controlled to scan a field of regard.
 82. The SLM of claim 79, wherein the one degree of freedom translation of the DCM is controlled to retract or elevate to lengthen or shorten the optical path of an image reflected to remove phase aberration from image.
 83. The SLM of claim 79, wherein the one degree of freedom rotation of the DCM is controlled to scan a field of regard, which the DCM can also retract or elevate to lengthen or shorten the optical path of an image reflected to remove phase aberration from image.
 84. The SLM of claim 79, wherein the two degrees of freedom rotation of the DCM is controlled to scan a field of regard, which the DCM can also retract or elevate to lengthen or shorten the optical path of an image reflected to remove phase aberration from image.
 85. The DCM array of claim 77, wherein a control circuitry is constructed under the micromirror using microelectronics technologies.
 86. The DCM of claim 85, wherein a thick oxide is deposited over metal of the microelectronics circuits. 